He holds his Ph.D in Computer Vision & Image Processing also from the prestigious Birla Institute of Technology and Science (BITS Pilani) in Computer Vision & Image Processing under the esteemed guidance of Prof. R K Mittal , DIRECTOR, BITS Pilani, Dubai in 2006. Prof. Rajesh Siddavatam is the recipient of prestigious IEEE Senior Member AWARD in 2012 and ACM Senior Member Award in 2015.
Prof. Siddavatam has total Academic and Professional Experience of 19 years out of which 10 years with BITS Pilani in various Administrative positions (1998-2008) and with Jaypee University of Information Technology for 5 years ( 2009-2013) as DIRECTOR of Image Information Processing Research Group at JUIT, Solan and as DEAN at KIIT University, Bhubaneshwar for 2 years ( 2013-2015). During his tenure at BITS-Pilani for a decade, Prof. Siddavatam was responsible for the setting up of campus at BITS Pilani Hyderabad campus starting from the inception in 2006 and till its execution in 2008.
Prof. Siddavatam has been instrumental for establishing the BITS Admission Test and in effective governance of the same. He also has vast administrative experience of 15 years in setting up the campus for BITS Pilani, Hyderabad and he was on the Advisory Committee for BITS Pilani, Hyderabad. He was on the Academic Council as Advisory for KIIT University and Jaypee University of IT.
Prof. Siddavatam was the Founding General Chair for IEEE ICIIP 2011 & 2013 - IEEE International Conference on Image Information Processing related to Computer Graphics, Computer Vision and Image Processing and 2015 IEEE International Conference on Computer Graphics, Vision and Information Security. He is also the Member of IEEE Visualization and Graphics Technical Committee and IAENG.
Prof. Siddavatam is currently serving as Reviewer for IEEE Transactions on Image Processing, Elsevier International Journal of Visual Communication and Image Representation , Elsevier International Jounral of Applied Mathematics and Computation, and Program Committee Member of innumerable IEEE & Springer International Journals and Conferences Worldwide.